A Highly Accurate Microwave Method for Permittivity Determination using Corrected Scattering Parameter Measurements

Abstract

A promising microwave method has been proposed for permittivity determination of medium- and low-loss materials using scattering parameter measurements corrected by any calibration technique. The method eliminates the uncorrected signals, if any, present in the system as a result of imperfect calibration standards after the application of any calibration technique. We observed that the accuracy and repeatability of permittivity measurements are increased by the proposed method. The method can easily be realized by any calibration-independent method provided that the measurement system has initially been calibrated to the terminals of the measurement cell.