JOURNAL ARTICLE

Growth Mechanism of the Copper Oxide Nanowires from Copper Thin Films Deposited on CuO-Buffered Silicon Substrate

Yeon-Woong ParkNak‐Jin SeongHyun‐June JungAnupama ChandaSoon‐Gil Yoon

Year: 2010 Journal:   Journal of The Electrochemical Society Vol: 157 (6)Pages: K119-K119   Publisher: Institute of Physics

Abstract

The growth mechanism of the CuO single-crystal nanowires (NWs) for future device applications has been demonstrated using the copper films deposited on CuO-buffered substrates. The mechanism involves a two-step process: In the first step, hillocks of copper are formed to relieve the compressive stress existing on the copper films at high temperature for a long duration of time in air and then phase is formed by the oxidation of the hillocks in air ambient. The second step involves a continuous supply of copper through the porous seed and then the transformation of the phase to CuO NW. The CuO NW was grown by a continuous supply of both copper from the copper films and oxygen from air. The indispensable requirements for CuO NW growth from the copper films are the presence of compressive stress in the copper films and the presence of the seed phase on the copper films at a high temperature in air.

Keywords:
Hillock Copper Materials science Substrate (aquarium) Silicon Copper oxide Porous silicon Chemical engineering Copper plating Composite material Metallurgy Layer (electronics) Electroplating

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17
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0.93
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Citation History

Topics

ZnO doping and properties
Physical Sciences →  Materials Science →  Materials Chemistry
Copper-based nanomaterials and applications
Physical Sciences →  Materials Science →  Materials Chemistry
Electronic and Structural Properties of Oxides
Physical Sciences →  Materials Science →  Materials Chemistry
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