K.N. AndersenP. C. NielsenWinnie Edith Svendsen
The material properties of silicon rich nitride thin films are presented. Waveguides have been processed with this material as a core layer using LPCVD. The optical loss has been measured in straight waveguides of varying thickness.
S. HabermehlRoger ApodacaRobert Kaplar
Toshiyuki MineKoji FujisakiTakeshi IshidaYasuhiro ShimamotoRenichi YamadaKazuyoshi Torii