JOURNAL ARTICLE
New data-processing technique for measurement of metallic foil thickness with differential white-light interferometry
Yanli DuHuimin YanYongjun NieXiuda ZhangMinmin Zheng
Year: 2006 Journal: Optics and Lasers in Engineering Vol: 45 (1)Pages: 240-244 Publisher: Elsevier BV
Keywords:
FOIL method Interferometry White light interferometry Optics Materials science Differential (mechanical device) White light White (mutation) Optoelectronics Composite material Physics
Metrics
5
Cited By
0.60
FWCI (Field Weighted Citation Impact)
12
Refs
0.66
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Citation History
Topics
Optical measurement and interference techniques
Physical Sciences → Computer Science → Computer Vision and Pattern Recognition
Advanced Measurement and Metrology Techniques
Physical Sciences → Engineering → Mechanical Engineering
Advanced Fiber Optic Sensors
Physical Sciences → Engineering → Electrical and Electronic Engineering
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