Fourier analysis of high-spatial-frequency holographic phase gratings

Abstract

Plane-wave holograms were recorded on Agfa–Gevaert 8E75HD holographic plates, in a wide range of bias exposures and fringe visibilities. Plates were processed by developer AAC and bleaching agent R-9. Phase gratings were studied by phase-contrast microscopy, using a high-power immersion (100×) objective. Phase-contrast photomicrographs were Fourier analysed. Thus first-, second- and third-order modulations of the refractive index as functions of bias exposure and visibility of the recording interference pattern could be determined. Relative amplitudes of the higher-order modulations to that of the first-order modulation can serve as a measure of the nonlinearity of the holographic recording. The results presented here can be used to check the validity of grating profile calculations based on higher-order coupled-wave theory.