Thickness-ratio-dependent dielectric properties of Bi1.5Zn1.0Nb1.5O7/Ba0.5Sr0.5TiO3 bilayered thin films

Ruguan Li; Shuwen Jiang; Libin Gao; Yanrong Li

doi:10.1016/j.mseb.2013.04.010

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Thickness-ratio-dependent dielectric properties of Bi1.5Zn1.0Nb1.5O7/Ba0.5Sr0.5TiO3 bilayered thin films

Ruguan Li Shuwen Jiang Libin Gao Yanrong Li

Year: 2013 Journal: Materials Science and Engineering B Vol: 178 (14)Pages: 911-916 Publisher: Elsevier BV

DOI: 10.1016/j.mseb.2013.04.010

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Keywords:

Materials science Dielectric Dielectric loss Thin film Sapphire Electric field Commutation Sputter deposition Composite material Sputtering Optoelectronics Optics Electrical engineering Voltage Nanotechnology

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Ferroelectric and Piezoelectric Materials

Physical Sciences → Materials Science → Materials Chemistry

Microwave Dielectric Ceramics Synthesis

Physical Sciences → Engineering → Electrical and Electronic Engineering

Dielectric properties of ceramics

Physical Sciences → Materials Science → Materials Chemistry

Thickness-ratio-dependent dielectric properties of Bi1.5Zn1.0Nb1.5O7/Ba0.5Sr0.5TiO3 bilayered thin films

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