JOURNAL ARTICLE

Thickness-ratio-dependent dielectric properties of Bi1.5Zn1.0Nb1.5O7/Ba0.5Sr0.5TiO3 bilayered thin films

Ruguan LiShuwen JiangLibin GaoYanrong Li

Year: 2013 Journal:   Materials Science and Engineering B Vol: 178 (14)Pages: 911-916   Publisher: Elsevier BV
Keywords:
Materials science Dielectric Dielectric loss Thin film Sapphire Electric field Commutation Sputter deposition Composite material Sputtering Optoelectronics Optics Electrical engineering Voltage Nanotechnology

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Citation History

Topics

Ferroelectric and Piezoelectric Materials
Physical Sciences →  Materials Science →  Materials Chemistry
Microwave Dielectric Ceramics Synthesis
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Dielectric properties of ceramics
Physical Sciences →  Materials Science →  Materials Chemistry
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