JOURNAL ARTICLE

Electronic properties and Schottky barrier of the porous silicon—Au interface

R. LaihoAlexander A. Pavlov

Year: 1995 Journal:   Thin Solid Films Vol: 255 (1-2)Pages: 276-278   Publisher: Elsevier BV
Keywords:
Porous silicon Materials science Silicon Wafer Schottky barrier Capacitance Optoelectronics Schottky diode Capacitor Voltage Electrical engineering Chemistry Electrode

Metrics

13
Cited By
0.96
FWCI (Field Weighted Citation Impact)
19
Refs
0.71
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Silicon Nanostructures and Photoluminescence
Physical Sciences →  Materials Science →  Materials Chemistry
Semiconductor materials and interfaces
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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