Molecular {(SnO)6} Trapped by Two {R2Si2O3} Fragments: X‐ray Single‐Crystal Structure of [(SnO)6(R2Si2O3)2]

U.N. Nehete; Vadapalli Chandrasekhar; Ganapathi Anantharaman; Herbert W. Roesky; D. Vidovic; Jörg Magull

doi:10.1002/ange.200454149

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Molecular {(SnO)₆} Trapped by Two {R₂Si₂O₃} Fragments: X‐ray Single‐Crystal Structure of [(SnO)₆(R₂Si₂O₃)₂]

U.N. Nehete Vadapalli Chandrasekhar Ganapathi Anantharaman Herbert W. Roesky D. Vidovic Jörg Magull

Year: 2004 Journal: Angewandte Chemie Vol: 116 (29)Pages: 3930-3932 Publisher: Wiley

DOI: 10.1002/ange.200454149

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Keywords:

Crystallography Crystal structure X-ray crystallography X-ray Materials science Chemistry Diffraction Physics Optics

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Silicone and Siloxane Chemistry

Physical Sciences → Materials Science → Materials Chemistry

Analytical chemistry methods development

Physical Sciences → Chemistry → Analytical Chemistry

Radioactive element chemistry and processing

Physical Sciences → Chemistry → Inorganic Chemistry

Molecular {(SnO)₆} Trapped by Two {R₂Si₂O₃} Fragments: X‐ray Single‐Crystal Structure of [(SnO)₆(R₂Si₂O₃)₂]

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Molecular {(SnO)6} Trapped by Two {R2Si2O3} Fragments: X‐ray Single‐Crystal Structure of [(SnO)6(R2Si2O3)2]

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