Structural property of polycrystalline silicon films on aluminum-doped zinc oxide-coated glass

Weiyan Wang; Jinhua Huang; Xianpeng Zhang; Ye Yang; Ruiqin Tan; Weijie Song

doi:10.1016/j.jcrysgro.2011.06.028

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Structural property of polycrystalline silicon films on aluminum-doped zinc oxide-coated glass

Weiyan Wang Jinhua Huang Xianpeng Zhang Ye Yang Ruiqin Tan Weijie Song

Year: 2011 Journal: Journal of Crystal Growth Vol: 328 (1)Pages: 30-33 Publisher: Elsevier BV

DOI: 10.1016/j.jcrysgro.2011.06.028

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Keywords:

Materials science Diffractometer Raman spectroscopy Amorphous solid Silicon Crystallite Annealing (glass) Doping Polycrystalline silicon Zinc Transmission electron microscopy Chemical engineering Scanning electron microscope Analytical Chemistry (journal) Composite material Crystallography Nanotechnology Metallurgy Optics Chemistry Optoelectronics Layer (electronics)

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Thin-Film Transistor Technologies

Physical Sciences → Engineering → Electrical and Electronic Engineering

Silicon Nanostructures and Photoluminescence

Physical Sciences → Materials Science → Materials Chemistry

Silicon and Solar Cell Technologies

Physical Sciences → Engineering → Electrical and Electronic Engineering

Structural property of polycrystalline silicon films on aluminum-doped zinc oxide-coated glass

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