Probing the excited state distributions of CdTe∕ZnTe self-assembled quantum dots using resonant Raman scattering

Abstract

Resonant Raman scattering is a sensitive means to probe electronic states in semiconductor materials even when such states are not accessible either through photoluminescence or transport techniques. We show that resonant Raman scattering can be used to probe the excited state distribution of CdTe∕ZnTe quantum dots at room temperature. In particular we apply this technique to study the changes of such quantum dots after rapid thermal annealing.