Preferred orientations in polycrystalline SnO2 films grown by atmospheric pressure chemical vapor deposition

Roman Y. Korotkov; P. Ricou; A. J. E. Farran

doi:10.1016/j.tsf.2005.07.248

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Preferred orientations in polycrystalline SnO2 films grown by atmospheric pressure chemical vapor deposition

Roman Y. Korotkov P. Ricou A. J. E. Farran

Year: 2005 Journal: Thin Solid Films Vol: 502 (1-2)Pages: 79-87 Publisher: Elsevier BV

DOI: 10.1016/j.tsf.2005.07.248

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Keywords:

Crystallite Nucleation Chemical vapor deposition Tin Texture (cosmology) Deposition (geology) Chemical engineering Materials science Chemistry Mineralogy Crystallography Nanotechnology Metallurgy Organic chemistry Geology

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ZnO doping and properties

Physical Sciences → Materials Science → Materials Chemistry

Gas Sensing Nanomaterials and Sensors

Physical Sciences → Engineering → Electrical and Electronic Engineering

Electronic and Structural Properties of Oxides

Physical Sciences → Materials Science → Materials Chemistry

Preferred orientations in polycrystalline SnO2 films grown by atmospheric pressure chemical vapor deposition

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