JOURNAL ARTICLE

Photoreflectance study of electric fields in ZnSe from ZnSe/GaAs/GaAs heterostructures

M. E. ConstantinoB. Salazar-Hernández

Year: 2000 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 4087 Pages: 541-541   Publisher: SPIE

Abstract

ZnSe/GaAs/GaAs heterostructures grown by Molecular Beam Epitaxy have been studied by Photoreflectance. From Franz-Keldysh oscillations we found the electric fields at ZnSe. It was observed that the electric field value decreases with the temperature. The calculated values (<58 kV/cm) are in agreement with the typical values in semiconductors and are higher than those at the interfacial GaAs. The electric field strength is conelated with the presence of superficial states due to defects such as dislocations.

Keywords:
Electric field Heterojunction Molecular beam epitaxy Materials science Semiconductor Optoelectronics Gallium arsenide Condensed matter physics Semiconductor materials Epitaxy Physics Nanotechnology

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Semiconductor Quantum Structures and Devices
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