Thermal Diffusivity Measurement of Two-Layer Optical Thin-Film Systems Using Photoacoustic Effect1

Kyong Up Kwon; M.H. Choi; Seung‐Whan Kim; Sung Hong Hahn; D. J. Seong; J. C. Kim; Seung Hwan Lee

doi:10.1023/a:1006612403028

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Thermal Diffusivity Measurement of Two-Layer Optical Thin-Film Systems Using Photoacoustic Effect1

Kyong Up Kwon M.H. Choi Seung‐Whan Kim Sung Hong Hahn D. J. Seong J. C. Kim Seung Hwan Lee

Year: 2000 Journal: International Journal of Thermophysics Vol: 21 (2)Pages: 543-552 Publisher: Springer Science+Business Media

DOI: 10.1023/a:1006612403028

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Keywords:

Materials science Thermal diffusivity Coating Optics Substrate (aquarium) Photoacoustic imaging in biomedicine Refractive index Microstructure Dielectric Laser Layer (electronics) Evaporation Thermal Composite material Optoelectronics

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Thermography and Photoacoustic Techniques

Physical Sciences → Engineering → Mechanics of Materials

Engineering Applied Research

Physical Sciences → Engineering → Civil and Structural Engineering

Surface Roughness and Optical Measurements

Physical Sciences → Engineering → Computational Mechanics

Thermal Diffusivity Measurement of Two-Layer Optical Thin-Film Systems Using Photoacoustic Effect1

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