JOURNAL ARTICLE
Contact effects on silicon surface flashover studies
Abstract
We studied the breakdown of n/sup +/nn/sup +/ silicon devices in vacuum and various dielectric fluids. The breakdown voltage exhibited a dependence on the abruptness of the high-low junction and on the dielectric constant of the surrounding dielectric liquid.
Keywords:
Dielectric Arc flash Silicon Materials science Dielectric strength Breakdown voltage Electric breakdown Optoelectronics Liquid dielectric Constant voltage Voltage Permittivity Electrical engineering Composite material Engineering physics Engineering
Metrics
5
Cited By
0.32
FWCI (Field Weighted Citation Impact)
2
Refs
0.62
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Topics
Semiconductor materials and devices
Physical Sciences → Engineering → Electrical and Electronic Engineering
High voltage insulation and dielectric phenomena
Physical Sciences → Materials Science → Materials Chemistry
Electrostatic Discharge in Electronics
Physical Sciences → Engineering → Electrical and Electronic Engineering
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