Imperfection-Immune Carbon Nanotube VLSI Circuits

Nishant Patil; Albert Lin; Jie Zhang; Hai Wei; H.‐S. Philip Wong; Subhasish Mitra

doi:10.1007/978-1-4419-7609-3_8

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Imperfection-Immune Carbon Nanotube VLSI Circuits

Nishant Patil Albert Lin Jie Zhang Hai Wei H.‐S. Philip Wong Subhasish Mitra

Year: 2010 Pages: 277-305

DOI: 10.1007/978-1-4419-7609-3_8

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Keywords:

Very-large-scale integration Carbon nanotube Electronic circuit CMOS Materials science Nanotechnology Transistor Logic gate Electronic engineering Carbon nanotube field-effect transistor Adder Computer science Field-effect transistor Electrical engineering Engineering Optoelectronics Voltage

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Carbon Nanotubes in Composites

Physical Sciences → Materials Science → Materials Chemistry

Neuroscience and Neural Engineering

Life Sciences → Neuroscience → Cellular and Molecular Neuroscience

Analog and Mixed-Signal Circuit Design

Physical Sciences → Engineering → Biomedical Engineering

Imperfection-Immune Carbon Nanotube VLSI Circuits

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