Large-Area Phase-Contrast X-ray Imaging System Using a Two-Crystal X-ray Interferometer—Development of an Interference-Pattern-Based Feedback Positioning System

Akio Yoneyama

doi:10.1063/1.1758039

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Large-Area Phase-Contrast X-ray Imaging System Using a Two-Crystal X-ray Interferometer—Development of an Interference-Pattern-Based Feedback Positioning System

Akio Yoneyama

Year: 2004 Journal: AIP conference proceedings Vol: 705 Pages: 1299-1302 Publisher: American Institute of Physics

DOI: 10.1063/1.1758039

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Abstract

journal article

Keywords:

Interference (communication) Interferometry Optics Phase (matter) SIGNAL (programming language) Physics Crystal (programming language) Rotation (mathematics) Contrast (vision) Beam (structure) Signal beam Materials science Computer science Computer vision Telecommunications

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Advanced X-ray Imaging Techniques

Physical Sciences → Physics and Astronomy → Radiation

Advanced MRI Techniques and Applications

Health Sciences → Medicine → Radiology, Nuclear Medicine and Imaging

Crystallography and Radiation Phenomena

Physical Sciences → Physics and Astronomy → Condensed Matter Physics

Large-Area Phase-Contrast X-ray Imaging System Using a Two-Crystal X-ray Interferometer—Development of an Interference-Pattern-Based Feedback Positioning System

Abstract

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