JOURNAL ARTICLE

Overview of variable-angle spectroscopic ellipsometry (VASE): II. Advanced applications

Blaine JohsJohn A. WoollamCraig M. HerzingerJames N. HilfikerR. A. SynowickiCorey Bungay

Year: 1999 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 10294 Pages: 1029404-1029404   Publisher: SPIE

Abstract

A preceding companion paper provides a general introduction to Variable Angle Spectroscopic Ellipsometry (VASE), and also describes many typical applications of the technique. In this paper, more advanced VASE applications are discussed. These applications rely on recent advances in ellipsometric hardware, which allow extremely accurate ellipsometric data to be acquired over a broad spectral range, from the IR to VUV. This instrumentation can also quantitatively measure the optical response of nonisotropic samples. Advanced data analysis techniques are also presented.

Keywords:
Ellipsometry Instrumentation (computer programming) Optics Materials science Computer science Physics Nanotechnology Thin film

Metrics

101
Cited By
2.25
FWCI (Field Weighted Citation Impact)
0
Refs
0.85
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Optical Polarization and Ellipsometry
Physical Sciences →  Engineering →  Biomedical Engineering
Spectroscopy and Chemometric Analyses
Physical Sciences →  Chemistry →  Analytical Chemistry
Spectroscopy Techniques in Biomedical and Chemical Research
Life Sciences →  Biochemistry, Genetics and Molecular Biology →  Biophysics

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