Blaine JohsJohn A. WoollamCraig M. HerzingerJames N. HilfikerR. A. SynowickiCorey Bungay
A preceding companion paper provides a general introduction to Variable Angle Spectroscopic Ellipsometry (VASE), and also describes many typical applications of the technique. In this paper, more advanced VASE applications are discussed. These applications rely on recent advances in ellipsometric hardware, which allow extremely accurate ellipsometric data to be acquired over a broad spectral range, from the IR to VUV. This instrumentation can also quantitatively measure the optical response of nonisotropic samples. Advanced data analysis techniques are also presented.
John A. WoollamBlaine JohsCraig M. HerzingerJames N. HilfikerR. A. SynowickiCorey Bungay
Devproshad K. PaulAndrew FraserJoshua M. PearceKunal Karan