Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy

E.C. Cosgriff; Peter D. Nellist; A.J. D’Alfonso; Scott D. Findlay; G. Behan; Peng Wang; L. J. Allen; Angus I. Kirkland

doi:10.1016/s1076-5670(10)62002-2

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Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy

E.C. Cosgriff Peter D. Nellist A.J. D’Alfonso Scott D. Findlay G. Behan Peng Wang L. J. Allen Angus I. Kirkland

Year: 2010 Advances in imaging and electron physics Pages: 45-76 Publisher: Academic Press

DOI: 10.1016/s1076-5670(10)62002-2

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Keywords:

Contrast transfer function Optical sectioning Optics Spherical aberration Optical transfer function Scanning transmission electron microscopy Scanning confocal electron microscopy Lens (geology) Aperture (computer memory) Dark field microscopy Confocal Materials science Contrast (vision) Microscopy Physics Electron microscope

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Advanced Electron Microscopy Techniques and Applications

Life Sciences → Biochemistry, Genetics and Molecular Biology → Structural Biology

Electron and X-Ray Spectroscopy Techniques

Physical Sciences → Materials Science → Surfaces, Coatings and Films

Advanced Fluorescence Microscopy Techniques

Life Sciences → Biochemistry, Genetics and Molecular Biology → Biophysics

Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy

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