Novel probes for scanning near-field optical microscopy

JOURNAL ARTICLE

Year: 2012 Journal: Repository for Publications and Research Data (ETH Zurich) Publisher: ETH Zurich

DOI: 10.3929/ethz-a-007578086

Keywords:

Microscopy Optical microscope Optics Field (mathematics) Materials science Remote sensing Physics Geology Scanning electron microscope Mathematics

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Near-Field Optical Microscopy

Physical Sciences → Engineering → Biomedical Engineering

Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering

Force Microscopy Techniques and Applications

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics