Divide and conquer based Fast Shmoo algorithms

P. Patten

doi:10.1109/test.2004.1386953

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Divide and conquer based Fast Shmoo algorithms

P. Patten

Year: 2005 Pages: 197-202

DOI: 10.1109/test.2004.1386953

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Abstract

Shmoo-plots are a powerful characterization technique in digital IC testing. Utilization and number of ICs exposed are limited by high execution times. This work presents an effective Fast-Shmoo algorithm to accelerate device characterization. The robust optimization concept is adapted to specific device characterization needs and reduce test execution times significantly.

Keywords:

Divide and conquer algorithms Computer science Characterization (materials science) Parallel computing Algorithm Computer engineering

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Topics

Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering

VLSI and Analog Circuit Testing

Physical Sciences → Computer Science → Hardware and Architecture

Advancements in Photolithography Techniques

Physical Sciences → Engineering → Electrical and Electronic Engineering

Divide and conquer based Fast Shmoo algorithms

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Citation History

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