JOURNAL ARTICLE

Energy band bowing parameter in AlxGa1−xN alloys

Feng YunM. A. ReshchikovLei HeThomas J. KingH. Morkoç̌Steve NovakLuncun Wei

Year: 2002 Journal:   Journal of Applied Physics Vol: 92 (8)Pages: 4837-4839   Publisher: American Institute of Physics

Abstract

Molecular-beam epitaxy grown AlxGa1−xN alloys covering the entire range of alloy compositions, 0⩽x⩽1, have been used to determine the alloy band gap dependence on its composition. The Al chemical composition was deduced from secondary ion mass spectroscopy and Rutherford backscattering. The composition was also inferred from x-ray diffraction. The band gap of the alloy was extracted from low temperature optical reflectance measurements which are relatively more accurate than photoluminescence. Fitting of the band gap data resulted in a bowing parameter of b=1.0 eV over the entire composition range. The improved accuracy of the composition and band gap determination and the largest range of the Al composition over which our study has been conducted increase our confidence in this bowing parameter.

Keywords:
Bowing Band gap Alloy Materials science Chemical composition Photoluminescence Molecular beam epitaxy Spectroscopy Range (aeronautics) Wide-bandgap semiconductor Diffraction Analytical Chemistry (journal) Composition (language) Rutherford backscattering spectrometry Epitaxy Chemistry Optics Thin film Optoelectronics Metallurgy Physics Nanotechnology

Metrics

131
Cited By
4.20
FWCI (Field Weighted Citation Impact)
32
Refs
0.95
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

GaN-based semiconductor devices and materials
Physical Sciences →  Physics and Astronomy →  Condensed Matter Physics
Ga2O3 and related materials
Physical Sciences →  Materials Science →  Electronic, Optical and Magnetic Materials
ZnO doping and properties
Physical Sciences →  Materials Science →  Materials Chemistry

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