JOURNAL ARTICLE

Electrostatic charge sensor based on a micromachined resonator with dual micro-levers

Jiuxuan ZhaoHong DingJin Xie

Year: 2015 Journal:   Applied Physics Letters Vol: 106 (23)   Publisher: American Institute of Physics

Abstract

This paper describes an electrostatic charge sensor based on a microelectromechanical systems (MEMS) resonator with dual micro-levers to improve sensitivity. The device comprises a double-ended tuning fork resonant element working at out-of-phase mode with a quality factor (Q) of about 4900 under operating pressure of 40 mTorr. The resonant frequency shifts in proportion to an axial force induced by charge additions and then transformed by dual micro-levers with an amplification factor over 8. The measured responsivity is 1.3×10−3 Hz/fC2, which matches well with the results from analytical models and finite element method. The sensitivity of the charge sensor is 21 fC under 4 ppm frequency fluctuation. Additionally, electrostatic spring softening and nonlinear feature of the resonator are also investigated.

Keywords:
Resonator Tuning fork Microelectromechanical systems Materials science Sensitivity (control systems) Electrostatic induction Charge (physics) Q factor Voltage Optoelectronics Chemistry Physics Vibration Acoustics Electrical engineering Electronic engineering Engineering Electrode

Metrics

29
Cited By
3.59
FWCI (Field Weighted Citation Impact)
21
Refs
0.95
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Mechanical and Optical Resonators
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Advanced MEMS and NEMS Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Force Microscopy Techniques and Applications
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
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